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Using Atomic Diffraction of Na from Material Gratings to Measure Atom-Surface Interactions

机译:使用材料光栅中Na的原子衍射来测量原子-表面相互作用

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摘要

In atom optics a material structure is commonly regarded as an amplitude mask for atom waves. However, atomic diffraction patterns formed using material gratings indicate that material structures also operate as phase masks. In this study a well collimated beam of sodium atoms is used to illuminate a silicon nitride grating with a period of 100 nm. During passage through the grating slots atoms acquire a phase shift due to the van der Waals interaction with the grating walls. As a result the relative intensities of the matter-wave diffraction peaks deviate from those expected for a purely absorbing grating. Thus a complex transmission function is required to explain the observed diffraction envelopes. An optics perspective to the theory of atomic diffraction from material gratings is put forth in the hopes of providing a more intuitive picture concerning the influence of the vdW potential. The van der Waals coefficient $C_{3} = 2.7\pm 0.8{meV nm}^{3}$ is determined by fitting a modified Fresnel optical theory to the experimental data. This value of $C_{3}$ is consistent with a van der Waals interaction between atomic sodium and a silicon nitride surface.
机译:在原子光学中,材料结构通常被视为原子波的振幅掩模。但是,使用材料光栅形成的原子衍射图谱表明材料结构也可以用作相位掩模。在这项研究中,使用准直的钠原子束照射周期为100 nm的氮化硅光栅。在通过光栅狭缝的过程中,原子由于与光栅壁的范德华相互作用而获得相移。结果,物质波衍射峰的相对强度偏离了纯吸收光栅所预期的强度。因此,需要复杂的透射函数来解释观察到的衍射包络线。提出了从材料光栅进行原子衍射理论的光学视角,以期提供关于vdW势影响的更直观的图像。范德华系数$ C_ {3} = 2.7 \ pm 0.8 {meV nm} ^ {3} $通过将修正的菲涅耳光学理论拟合到实验数据来确定。 $ C_ {3} $的值与原子钠和氮化硅表面之间的范德华相互作用一致。

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